Morphology of nanoscale block copolymer films: A study by AFM and X-ray reflectivity

被引：0
|
作者：
Ribbe, Alexander E. [1 ]
Matsushige, Kazumi [1 ]
机构：
[1] Venture Business Laboratory, Kyoto University, Yoshida-hon-machi, Sakyo-ku, Kyoto, Japan
来源：
American Chemical Society, Polymer Preprints, Division of Polymer Chemistry | 2000年 / 41卷 / 01期
关键词：
Polyvinyl pyridine - X-ray reflectivity;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：321 / 322
相关论文
共 50 条
  • [21] X-ray and AFM studies of ultrathin films for EUV and soft X-ray applications
    Asadchikov, VE
    Duparré, A
    Kozhevnikov, IV
    Krivonosov, YS
    Sagitov, SI
    ADVANCES IN OPTICAL INTERFERENCE COATINGS, 1999, 3738 : 387 - 393
  • [22] ULTRATHIN FILMS IN WETTING EVIDENCED BY X-RAY REFLECTIVITY
    DAILLANT, J
    BENATTAR, JJ
    LEGER, L
    PHYSICAL REVIEW A, 1990, 41 (04): : 1963 - 1977
  • [23] Depth Profiling of Block Copolymer Nanostructures in Films by Small-Angle X-Ray Scattering Using an X-Ray Microbeam
    Sakurai, Shinichi
    Kimura, Go
    Mizuno, Yohei
    Masunaga, Hiroyasu
    Ogawa, Hiroki
    Ohta, Noboru
    Yagi, Naoto
    MACROMOLECULAR SYMPOSIA, 2013, 327 (01) : 121 - 127
  • [24] X-RAY PHOTOELECTRON-SPECTROSCOPY STUDIES ON BLOCK COPOLYMER THIN-FILMS
    THOMAS, HR
    OMALLEY, JJ
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1978, 175 (MAR): : 127 - 127
  • [25] AFM Tomography of Block Copolymer Thin Films
    Fukunaga, Kenji
    KOBUNSHI RONBUNSHU, 2008, 65 (03) : 269 - 272
  • [26] X-RAY PHOTOELECTRON-SPECTROSCOPY STUDIES ON BLOCK COPOLYMER THIN-FILMS
    THOMAS, HR
    OMALLEY, JJ
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (03): : 297 - 297
  • [27] Precise structural investigation of symmetric diblock copolymer thin films with resonant soft X-ray reflectivity
    Ma, Wei
    Vodungbo, Boris
    Nilles, Katja
    Liu, Ya
    Theato, Patrick
    Luning, Jan
    SOFT MATTER, 2013, 9 (37) : 8820 - 8825
  • [28] X-ray reflectivity of diblock copolymer monolayers at the air/water interface
    Li, Z
    Zhao, MW
    Quinn, J
    Rafailovich, MH
    Sokolov, J
    Lennox, RB
    Eisenberg, A
    Wu, XZ
    Kim, MW
    Sinha, SK
    Tolan, M
    LANGMUIR, 1995, 11 (12) : 4785 - 4792
  • [29] X-ray reflectivity study of the self-assembly of ordered lysozyme films
    Kayushina, RL
    Stepina, ND
    Belyaev, VV
    Khurgin, YI
    KRISTALLOGRAFIYA, 1996, 41 (01): : 156 - 161
  • [30] Soft x-ray resonant magnetic reflectivity study of thin films and multilayers
    Tonnerre, JM
    Sève, L
    Barbara-Dechelette, A
    Bartolomé, F
    Raoux, D
    Chakarian, V
    Kao, CC
    Fischer, H
    Andrieu, S
    Fruchart, O
    JOURNAL OF APPLIED PHYSICS, 1998, 83 (11) : 6293 - 6295
12345