Secondary-ion-mass-spectrometry study of low-energy ion-beam mixing of Au-Pt interfaces

被引：0
|
作者：
机构：
来源：
| 1600年 / 72期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [31] DISSOCIATIVE SCATTERING OF LOW-ENERGY N-2+ ION-BEAM ON PT(100)
    AKAZAWA, H
    MURATA, Y
    SURFACE SCIENCE, 1989, 207 (2-3) : L971 - L979
  • [32] SECONDARY ION MASS-SPECTROMETRY AND ITS RELATION TO HIGH-ENERGY ION-BEAM ANALYSIS TECHNIQUES
    MAGEE, CW
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1981, 191 (1-3): : 297 - 307
  • [33] CONSTRUCTION AND APPLICATIONS OF A DUAL MASS-SELECTED LOW-ENERGY ION-BEAM SYSTEM
    QIN, FG
    WANG, XM
    LIU, ZK
    YAO, ZY
    REN, ZZ
    LIN, LY
    SU, SJ
    JIANG, WS
    LAU, WM
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1991, 62 (10) : 2322 - 2325
  • [34] ION-BEAM MIXING AT NICKEL-SILICON INTERFACES
    AVERBACK, RS
    THOMPSON, LJ
    MOYLE, J
    SCHALIT, M
    JOURNAL OF APPLIED PHYSICS, 1982, 53 (03) : 1342 - 1349
  • [35] ION-BEAM MIXING OF CERAMIC-METAL INTERFACES
    CORTS, T
    TRAVERSE, A
    BOLSE, W
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 80-1 (pt 2) : 167 - 171
  • [36] ION-BEAM MIXING AT METAL-OXIDE INTERFACES
    FREIRE, FL
    STEDILE, FC
    JOURNAL OF PHYSICS-CONDENSED MATTER, 1993, 5 : A301 - A302
  • [37] Broad beam low-energy ion source for ion-beam assisted deposition and material processing
    Kotov, DA
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2004, 75 (05) : 1934 - 1936
  • [38] LOW-ENERGY ION-BEAM TRANSPORT BY PERMANENT-MAGNETS
    LEUNG, KN
    EHLERS, KW
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1979, 24 (08): : 1015 - 1015
  • [39] LOW-ENERGY ION-BEAM ANNEALING OF AMORPHISED LAYERS IN SI
    ZEROUAL, B
    CARTER, G
    VACUUM, 1991, 42 (8-9) : 525 - 531
  • [40] SILICIDE FORMATION STUDY ON LOW-ENERGY ION-BEAM PROCESSED SILICON.
    Climent, A.
    Fonash, S.J.
    Ponpon, J.P.
    Vacuum, 1985, 37 (5-6) : 486 - 487
12345