DANGLING-BOND RECOMBINATION AND PHOTOCONDUCTIVITY OF a-Si:H.

被引:0
|
作者
Kurova, I.A. [1 ]
Zvyagin, I.P. [1 ]
机构
[1] Moscow State Univ, Moscow, USSR, Moscow State Univ, Moscow, USSR
关键词
PHOSPHORUS - SEMICONDUCTING FILMS - Doping - SEMICONDUCTOR MATERIALS - Amorphous;
D O I
暂无
中图分类号
学科分类号
摘要
The temperature quenching of the photoconductivity of P-doped glow-discharge a-Si:H films was observed after the prolonged preliminary illumination. To explain it, a recombination model is discussed which takes into account the broadening of the distributions of energies of the dangling-bond states in the mobility gap and the effect of temperature on the optically induced repopulation of these states.
引用
收藏
页码:207 / 210
相关论文
共 50 条
  • [41] Small polaron formation in dangling-bond wires on the Si(001) surface
    Bowler, DR
    Fisher, AJ
    PHYSICAL REVIEW B, 2001, 63 (03)
  • [42] Created defect under illumination in a-Si:H: hydrogenated or isolated dangling bond ?
    Meftah, AF
    Meftah, AM
    Merazga, A
    VACUUM, 2004, 75 (03) : 269 - 273
  • [43] Analysis of effects of dangling-bond defects in doped a-Si:H layers in heterojunction silicon solar cells with different electron affinities of ITO contacts
    Balent, Jost
    Smole, Franc
    Topic, Marko
    Krc, Janez
    INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, 2022, 52 (02): : 129 - 142
  • [44] TWO COMPONENTS OF LIGHT-INDUCED PHOTOCONDUCTIVITY DECAYS IN a-Si:H.
    Kakinuma, Hiroaki
    Nishikawa, Satoshi
    Watanabe, Tsukasa
    Nihei, Kohji
    Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes, 1985, 24 (08): : 979 - 983
  • [45] ROLE OF DANGLING-BOND DEFECTS IN EARLY RECOMBINATION IN HYDROGENATED AMORPHOUS-SILICON
    WAKE, DR
    AMER, NM
    PHYSICAL REVIEW B, 1983, 27 (04): : 2598 - 2601
  • [46] Diffusion of hydrogen and creation/annihilation of dangling bond defects in a-Si:H films
    Das, UK
    Yasuda, T
    Yamasaki, S
    PROCEEDINGS OF THE 25TH INTERNATIONAL CONFERENCE ON THE PHYSICS OF SEMICONDUCTORS, PTS I AND II, 2001, 87 : 1481 - 1482
  • [47] Weak bond/dangling bond conversion model for light-induced defects in a-Si:H
    Santos, P.V.
    Jackson, W.B.
    Journal of Non-Crystalline Solids, 1991, 137-38 (pt 1) : 203 - 206
  • [48] DANGLING-BOND SURFACE-STATES ON SI AND GE (111) SURFACES
    NISHIDA, M
    JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1978, 11 (06): : 1217 - 1222
  • [49] RECOMBINATION-ENHANCED DEFECT FORMATION AND ANNEALING IN a-Si:H.
    Redfield, David
    1987,
  • [50] Effect of hydrogen on dangling bond in a-Si thin film
    Lim, P. K.
    Tam, W. K.
    Yeung, L. F.
    Lam, F. M.
    PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY, 2007, 61 : 708 - 712