OPTIMIZING THE IN-CIRCUIT TEST PROCESS.

被引：0

作者：

Curtis, Steve ^{[1
]}

Douglas, Phil ^{[1
]}

机构：

[1] Telex Corp, Raleigh, NC, USA, Telex Corp, Raleigh, NC, USA

来源：

Electron Manuf | 1988年 / 34卷 / 06期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

PRINTED CIRCUITS

引用

页码：11 / 13

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