MAGNETIC AND STRUCTURAL PROPERTIES OF MAGNETRON SPUTTERED CoCr THIN FILMS.

被引：0
|
作者：
Hoffmann, H. [1 ]
Kochanowsky, L. [1 ]
Maendl, H. [1 ]
Kastner, K. [1 ]
Mayr, M. [1 ]
Muenz, W.D. [1 ]
Roell, K. [1 ]
机构：
[1] Univ Regensburg, West Ger, Univ Regensburg, West Ger
来源：
IEEE Transactions on Magnetics | 1985年 / MAG-21卷 / 05期
关键词：
DATA STORAGE; MAGNETIC - Film - MAGNETIC MATERIALS - Thin Films - Magnetic measurements - MAGNETOMETERS - Applications - MICROSCOPES; ELECTRON; -; Applications;
D O I：
10.1109/tmag.1985.1063954
中图分类号：
学科分类号：
摘要：
The magnetic and structural properties of CoCr thin films prepared by magnetron sputtering at a deposition rate of up to 10 nm/s are characterized by various magnetometer measurements, TEM, and Lorentz microscopy. In particular, the anisotropy field H//K normal to the film plane is determined by three different methods (VSM, susceptibility, and torque). From the measurements, a model has been derived to explain the domain structure and the in-plane magnetization reversal. It is concluded that the condition H//K less than M//S is not stringent for perpendicular recording.
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页码：1432 / 1434
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