In-situ measurement of thin films on architectural glass

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作者：
Vergoehl, Michael
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来源：
Vakuum in Forschung und Praxis | 2000年 / 12卷 / 06期
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D O I：
10.1002/1522-2454(200012)12:63.0.CO;2-A
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页码：364 / 366
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