Universal Testing System for Metal-Oxide-Semiconductor Large-Scale Integration.

被引：0
|
作者：
Cozzi, Lucio
机构：
来源：
Elektronikpraxis | 1975年 / 10卷 / 12期
关键词：
INTEGRATED CIRCUIT TESTING;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
In the manufacture of large-scale integrated circuits, the necessity has arisen for automatic test systems which enable testing of parameters and functions of IC both in the wafer as well as in the encapsulation states. Such a modern test system is described.
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页码：74 / 75
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