Mo/Si and Mo/Be multilayer thin films on zerodur substrates for extreme-ultraviolet lithography

被引:0
|
作者
Mirkarimi, Paul B. [1 ]
Bajt, Sasa [1 ]
Wall, Mark A. [1 ]
机构
[1] Lawrence Livermore Natl. Laboratory, Mail Stop L-395, 7000 East Avenue, Livermore, CA 94550, United States
来源
Applied Optics | 2000年 / 39卷 / 10期
关键词
D O I
10.1364/ao.39.001617
中图分类号
学科分类号
摘要
Lithography
引用
收藏
页码:1617 / 1625
相关论文
共 50 条
  • [1] Mo/Si and Mo/Be multilayer thin films on Zerodur substrates for extreme-ultraviolet lithography
    Mirkarimi, PB
    Bajt, S
    Wall, MA
    APPLIED OPTICS, 2000, 39 (10) : 1617 - 1625
  • [2] Effects of Mo/Si multilayer coatings on the imaging characteristics of an extreme-ultraviolet lithography system
    Duddles, NJ
    APPLIED OPTICS, 1998, 37 (16): : 3533 - 3538
  • [3] Lifetime studies of Mo/Si and Mo/Be multilayer coatings for extreme ultraviolet lithography
    Wedowski, M
    Bajt, S
    Folta, JA
    Gullikson, EM
    Kleineberg, U
    Klebanoff, LE
    Malinowski, ME
    Clift, WM
    EUV, X-RAY, AND NEUTRON OPTICS AND SOURCES, 1999, 3767 : 217 - 224
  • [4] STRUCTURE AND PERFORMANCE OF SI/MO MULTILAYER MIRRORS FOR THE EXTREME-ULTRAVIOLET
    SLAUGHTER, JM
    SCHULZE, DW
    HILLS, CR
    MIRONE, A
    STALIO, R
    WATTS, RN
    TARRIO, C
    LUCATORTO, TB
    KRUMREY, M
    MUELLER, P
    FALCO, CM
    JOURNAL OF APPLIED PHYSICS, 1994, 76 (04) : 2144 - 2156
  • [5] Monitoring the Temperature of a Mo/Si Mirror with Photoluminescence in Extreme-Ultraviolet Lithography
    Lo, Jen-Iu
    Peng, Yu -Chain
    Lu, Hsiao-Chi
    Tseng, Ton-Rong
    Cheng, Bing -Ming
    ACS APPLIED ELECTRONIC MATERIALS, 2022, 4 (07) : 3435 - 3439
  • [6] Stress, reflectance, and temporal stability of sputter-deposited Mo Si and Mo Be multilayer films for extreme ultraviolet lithography
    Mirkarimi, PB
    OPTICAL ENGINEERING, 1999, 38 (07) : 1246 - 1259
  • [7] Method for repairing Mo/Si multilayer thin film phase defects in reticles for extreme ultraviolet lithography
    Mirkarimi, PB
    Stearns, DG
    Baker, SL
    Elmer, JW
    Sweeney, DW
    Gullikson, EM
    JOURNAL OF APPLIED PHYSICS, 2002, 91 (01) : 81 - 89
  • [8] High-performance Mo-Si multilayer coatings for extreme-ultraviolet lithography by ion-beam deposition
    Spiller, E
    Baker, SL
    Mirkarimi, PB
    Sperry, V
    Gullikson, EM
    Stearns, DG
    APPLIED OPTICS, 2003, 42 (19) : 4049 - 4058
  • [9] High-performance Mo-Si multilayer coatings for extreme-ultraviolet lithography by ion-beam deposition
    Spiller, Eberhard
    Baker, Sherry L.
    Mirkarimi, Paul B.
    Sperry, Victor
    Gullikson, Eric M.
    Stearns, Daniel G.
    Applied Optics, 2003, 42 (19): : 4049 - 4058
  • [10] DEFECT COVERAGE PROFILE AND PROPAGATION OF ROUGHNESS OF SPUTTER-DEPOSITED MO/SI MULTILAYER COATING FOR EXTREME-ULTRAVIOLET PROJECTION LITHOGRAPHY
    NGUYEN, KB
    NGUYEN, TD
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1993, 11 (06): : 2964 - 2970