ATTACHMENT TO EMV-100L ELECTRON MICROSCOPE FOR SPECIMEN IRRADIATION BY GAS-ION BEAM.

被引：0

作者：

Bendikov, V.I.

Tal'yanskaya, O.Ya.

Rybalko, V.F.

机构：

来源：

Instruments and experimental techniques New York | 1986年 / 29卷 / 5 pt 2期

关键词：

ELECTRONS - Diffraction - RADIATION DAMAGE;

D O I：

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摘要：

An attachment to the EMV-100L electron microscope is described for irradiation of specimens by separated gas ions with a mass of up to 40 amu and an energy of up to 15 keV. The beam-current density at the target is about 10 mu A/cm**2. Specimens can be heated in the range of 300-1000 degree K. The attachment is designed for study of radiation damage by electron microscopy and electron diffraction.

引用

页码：1210 / 1211