Atomic force microscopy using cantilevers with integrated tips and piezoelectric layers for actuation and detection

被引：0
|
作者：
Univ of Neuchatel, Neuchatel, Switzerland [1 ]
机构：
来源：
J Micromech Microengineering | / 3卷 / 218-220期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [41] Laser Actuation of Cantilevers for Picometre Amplitude Dynamic Force Microscopy
    Evans, Drew R.
    Tayati, Ponlawat
    An, Hongjie
    Lam, Ping Koy
    Craig, Vincent S. J.
    Senden, Tim J.
    SCIENTIFIC REPORTS, 2014, 4
  • [42] Laser Actuation of Cantilevers for Picometre Amplitude Dynamic Force Microscopy
    Drew R. Evans
    Ponlawat Tayati
    Hongjie An
    Ping Koy Lam
    Vincent S. J. Craig
    Tim J. Senden
    Scientific Reports, 4
  • [43] Self-sharpening tip integrated on micro cantilevers with self-exciting piezoelectric sensor for parallel atomic force microscopy
    Indermuhle, PF
    Schurmann, G
    Racine, GA
    deRooij, NF
    APPLIED PHYSICS LETTERS, 1997, 70 (17) : 2318 - 2320
  • [44] Polymer micro cantilevers for force controlled atomic force microscopy 2 - Fabrication of cantilevers
    Kato, N
    Park, CS
    Matsumoto, T
    Kikuta, H
    Iwata, K
    SICE 2002: PROCEEDINGS OF THE 41ST SICE ANNUAL CONFERENCE, VOLS 1-5, 2002, : 1033 - 1034
  • [45] Simultaneous Atomic Imaging of Atomic Force Microscopy and Scanning Tunneling Microscopy Using Metal Coated Cantilevers
    Sawada, Daisuke
    Hirai, Akira
    Sugimoto, Yoshiaki
    Abe, Masayuki
    Morita, Seizo
    MATERIALS TRANSACTIONS, 2009, 50 (05) : 940 - 942
  • [46] Contact atomic force microscopy using piezoresistive cantilevers in load force modulation mode
    Biczysko, P.
    Dzierka, A.
    Jozwiak, G.
    Rudek, M.
    Gotszalk, T.
    Janus, P.
    Grabiec, P.
    Rangelow, I. W.
    ULTRAMICROSCOPY, 2018, 184 : 199 - 208
  • [47] Conductive tips for atomic force microscopy
    不详
    INDUSTRIAL CERAMICS, 2005, 25 (02): : 139 - 139
  • [48] Gel tips for atomic force microscopy
    Sano, M
    Okamura, J
    Shinkai, S
    LANGMUIR, 1999, 15 (23) : 7890 - 7893
  • [49] Piezoelectric hysteresis measurement using atomic force microscopy
    Shin, H
    Shin, JK
    Hong, SB
    Jeon, JU
    Song, HW
    Hong, JI
    No, K
    INTEGRATED FERROELECTRICS, 2001, 38 (1-4) : 675 - 682
  • [50] An Integrated Magnetic Actuation System for High-Speed Atomic Force Microscopy
    Sriramshankar, R.
    Jayanth, G. R.
    IEEE-ASME TRANSACTIONS ON MECHATRONICS, 2018, 23 (05) : 2285 - 2294
12345