A micromission for Mars sample return

被引：0
|
作者：
Parkinson, Bob [1 ]
Kemble, Steve [2 ]
机构：
[1] 33 Langdon Avenue, Aylesbury HP 21 9UW, United Kingdom
[2] Astrium Ltd., Gunnels Wood Road, Stevenage SG1 2AS, United Kingdom
来源：
JBIS - Journal British Interplanetary Society | 2004年 / 57卷 / 7-8期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Martian surface analysis
引用
收藏
页码：256 / 261
相关论文
共 50 条
  • [41] Calls grow for a safer Mars Sample Return
    Marks, Paul
    AEROSPACE AMERICA, 2022, 60 (06) : 36 - 39
  • [42] Pop culture analog for Mars Sample Return
    Allen, Robert
    AEROSPACE AMERICA, 2022, 60 (08) : 5 - 5
  • [43] Earth impact studies for Mars sample return
    Fasanella, EL
    Jones, Y
    Knight, NF
    Kellas, S
    JOURNAL OF SPACECRAFT AND ROCKETS, 2002, 39 (02) : 237 - 243
  • [44] Mars Sample Return - Studies for a fresh look
    Mattingly, R
    Matousek, S
    Gershman, R
    2002 IEEE AEROSPACE CONFERENCE PROCEEDINGS, VOLS 1-7, 2002, : 493 - 509
  • [45] Mars Sample Return Campaign Concept Status
    Muirhead, Brian K.
    Nicholas, Austin K.
    Umland, Jeffrey
    Sutherland, Orson
    Vijendran, Sanjay
    Acta Astronautica, 2020, 176 : 131 - 138
  • [46] The scientific value of Mars Sample Return Introduction
    McSween, Harry Y.
    Thiemens, Mark H.
    PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2025, 122 (02)
  • [47] Mars sample return: The critical next step
    Clark, Benton C.
    ACTA ASTRONAUTICA, 2007, 61 (1-6) : 95 - 100
  • [48] Sample Acquisition and Caching Architecture for the Mars Sample Return Mission
    Zacny, Kris
    Chu, Philip
    Cohen, Joanna
    Paulsen, Gale
    Craft, Jack
    Szwarc, Timothy
    2013 IEEE AEROSPACE CONFERENCE, 2013,
  • [49] Mars Sample Return Mission Concept Status
    Muirhead, Brian K.
    Nicholas, Austin
    Umland, Jeff
    2020 IEEE AEROSPACE CONFERENCE (AEROCONF 2020), 2020,
  • [50] Planetary protection technology for Mars sample return
    Gershman, Robert
    Adams, Marc
    Dillman, Robert
    Fragola, Joseph
    2005 IEEE Aerospace Conference, Vols 1-4, 2005, : 996 - 1005
12345