Characterization of low-pressure chemical vapor deposited polycrystalline silicon thin-film transistors by low-frequency noise measurements

被引：0
|
作者：
Dimitriadis, Charalabos A. [1 ]
Brini, Jean [1 ]
Kamarinos, Georges [1 ]
Ghibaudo, Gerard [1 ]
机构：
[1] ENSERG, Grenoble, France
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers | 1998年 / 37卷 / 01期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：72 / 77
相关论文
共 50 条
  • [31] Low-frequency noise in a thin active layer α-Si:H thin-film transistors
    Chen, XY
    Deen, MJ
    van Rheenen, AD
    Peng, CX
    Nathan, A
    JOURNAL OF APPLIED PHYSICS, 1999, 85 (11) : 7952 - 7957
  • [32] Low-frequency noise in polysilicon Source-Gated Thin-Film transistors☆
    Chen, Q.
    Van Brandt, L.
    Kilchytska, V.
    Bestelink, E.
    Sporea, R. A.
    Flandre, D.
    SOLID-STATE ELECTRONICS, 2025, 226
  • [33] Characterization of polycrystalline silicon thin-film transistors
    Sameshima, Toshiyuki
    Kimura, Mutsumi
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2006, 45 (3 A): : 1534 - 1539
  • [34] Characterization of polycrystalline silicon thin-film transistors
    Sameshima, T
    Kimura, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2006, 45 (3A): : 1534 - 1539
  • [35] Noise sources in polycrystalline silicon thin-film transistors
    Han, IK
    Park, YJ
    Cho, WJ
    Choi, WJ
    Lee, JG
    Chovet, A
    Brini, J
    PROGRESS IN SEMICONDUCTORS II- ELECTRONIC AND OPTOELECTRONIC APPLICATIONS, 2003, 744 : 481 - 486
  • [36] Influence of flexible substrate in low temperature polycrystalline silicon thin-film transistors: temperature dependent characteristics and low frequency noise analysis
    Kim, Donghyun
    Kim, Jungchun
    Kang, Haeyong
    Shim, Jae Won
    Lee, Jae Woo
    NANOTECHNOLOGY, 2020, 31 (43)
  • [37] CHARACTERIZATION OF SEMIINSULATING POLYCRYSTALLINE SILICON PREPARED BY LOW-PRESSURE CHEMICAL-VAPOR-DEPOSITION
    CHAO, TS
    LEE, CL
    LEI, TF
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1993, 140 (09) : 2645 - 2648
  • [38] ELECTROMIGRATION DETECTION BY MEANS OF LOW-FREQUENCY NOISE MEASUREMENTS IN THIN-FILM INTERCONNECTIONS
    DILIGENTI, A
    NERI, B
    BAGNOLI, PE
    BARSANTI, A
    RIZZO, M
    IEEE ELECTRON DEVICE LETTERS, 1985, 6 (11) : 606 - 608
  • [39] Low-frequency noise parameter extraction in poly-Si thin-film transistors
    Nam, H
    Yang, HS
    Lee, J
    Chovet, A
    Szentpali, B
    Kim, E
    NOISE IN DEVICES AND CIRCUITS III, 2005, 5844 : 200 - 207
  • [40] Low-Frequency Noise Properties in P-Type SnO Thin-Film Transistors
    Jeong, Chan-Yong
    Lee, Jeong-Hwan
    Choi, Yong-Jin
    Lee, Chang-Woo
    Song, Sang-Hun
    Kwon, Hyuck-In
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2016, 16 (11) : 11381 - 11385
12345