Interconnect coupling noise in CMOS VLSI circuits

被引：0
|
作者：
Tang, Kevin T. [1 ]
Friedman, Eby G. [1 ]
机构：
[1] Univ of Rochester, Rochester, NY, United States
来源：
Proceedings of the International Symposium on Physical Design | 1999年
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：48 / 53
相关论文
共 50 条
  • [21] A novel delay model of CMOS VLSI circuits
    Chang, Jian
    Johnson, Louis G.
    IEEE MWSCAS'06: PROCEEDINGS OF THE 2006 49TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL II, 2006, : 481 - +
  • [22] Modelling noise and delay in VLSI circuits
    Pamunuwa, D
    Elassaad, S
    Tenhunen, H
    ELECTRONICS LETTERS, 2003, 39 (03) : 269 - 271
  • [23] SURFACE INDUCED LATCHUP IN VLSI CMOS CIRCUITS
    TAKACS, D
    WERNER, C
    HARTER, J
    SCHWABE, U
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1984, 31 (03) : 279 - 286
  • [24] NOISE SPIKES IN DIGITAL VLSI CIRCUITS
    WALLMARK, JT
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1982, 29 (03) : 451 - 458
  • [25] Analysis of the contribution of interconnect effects in energy dissipation of VLSI circuits
    Isern, E
    Roca, M
    Moll, F
    INTEGRATED CIRCUIT AND SYSTEM DESIGN: POWER AND TIMING MODELING, OPTIMIZATION AND SIMULATION, 2003, 2799 : 481 - 490
  • [26] A NEW LOCAL INTERCONNECT TECHNIQUE FOR VLSI SUBMICROMETER CMOS APPLICATIONS
    TANG, TE
    WEI, CC
    HAKEN, RA
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1986, 33 (11) : 1849 - 1849
  • [27] Interconnect mode conversion in high-speed VLSI circuits
    Quéré, Y
    LeGouguec, T
    Martin, PM
    Huret, F
    ISQED 2004: 5TH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, PROCEEDINGS, 2004, : 265 - 270
  • [28] Fault simulation of interconnect opens in digital CMOS circuits
    Konuk, H
    1997 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN - DIGEST OF TECHNICAL PAPERS, 1997, : 548 - 554
  • [29] Probabilistic analysis of interconnect coupling noise
    Vrudhula, S
    Blaauw, DT
    Sirichotiyakul, S
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2003, 22 (09) : 1188 - 1203
  • [30] Noise investigations of 90 nm VLSI CMOS technologies for analog integrated circuits at millimeter wave frequencies
    Ellinger, F
    Schmatz, M
    Jäckel, H
    NOISE IN DEVICES AND CIRCUITS II, 2004, 5470 : 131 - 140
12345