Interconnect coupling noise in CMOS VLSI circuits

被引：0
|
作者：
Tang, Kevin T. [1 ]
Friedman, Eby G. [1 ]
机构：
[1] Univ of Rochester, Rochester, NY, United States
来源：
Proceedings of the International Symposium on Physical Design | 1999年
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页码：48 / 53
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