Interconnect coupling noise in CMOS VLSI circuits

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作者：

Tang, Kevin T. ^{[1
]}

Friedman, Eby G. ^{[1
]}

机构：

[1] Univ of Rochester, Rochester, NY, United States

来源：

Proceedings of the International Symposium on Physical Design | 1999年

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页码：48 / 53

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