Simulating total-dose and dose-rate effects on digital microelectronics timing delays using VHDL

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作者：
Brothers Jr., C.P. [1 ]
Pugh, R.D. [1 ]
机构：
[1] USAF Phillips Lab, Kirtland AFB, United States
来源：
IEEE Transactions on Nuclear Science | 1995年 / 42卷 / 6 pt 1期
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页码：1628 / 1635
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