Simulating total-dose and dose-rate effects on digital microelectronics timing delays using VHDL

被引：0

作者：

Brothers Jr., C.P. ^{[1
]}

Pugh, R.D. ^{[1
]}

机构：

[1] USAF Phillips Lab, Kirtland AFB, United States

来源：

IEEE Transactions on Nuclear Science | 1995年 / 42卷 / 6 pt 1期

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摘要：

引用

页码：1628 / 1635

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