A self-consistent technique for the analysis of the temperature dependence of current-voltage and capacitance-voltage characteristics of a tunnel metal-insulator-semiconductor structure

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作者：
Cova, P. [1 ]
Singh, A. [1 ]
Masut, R.A. [2 ]
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[1] Departamento de Física, Universidad de Oriente, Laboratorio de Simulación de Dispositivos Semiconductores, Apartado 124, Cumaná 6101, Sucre, Venezuela
[2] Département de Génie Physique, Groupe de Recherche en Physique et Technologie des Couches Minces, Ecole Polytechnique, C.P. 6079, Succ. Centre-ville, Montréal, QC H3C 3A7, Canada
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| 1600年 / American Institute of Physics Inc.卷 / 82期
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