Surface and subsurface properties of a BaLi4 gettering alloy studied using X-ray photoemission spectroscopy

被引：0
|
作者：
Magnano, E. [1 ]
Vandre, S. [1 ]
Kovac, J. [1 ]
Narducci, E. [1 ]
Caloi, R. [1 ]
Manini, P. [1 ]
Sancrotti, M. [1 ]
机构：
[1] Laboratorio Nazionale TASC-INFM, Trieste, Italy
来源：
Surface Science | 1998年 / 402-404卷 / 1-3期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：223 / 226
相关论文
共 50 条
  • [41] Band alignments in Fe/graphene/Si(001) junctions studied by x-ray photoemission spectroscopy
    Le Breton, J. -C.
    Tricot, S.
    Delhaye, G.
    Lepine, B.
    Turban, P.
    Schieffer, P.
    APPLIED PHYSICS LETTERS, 2016, 109 (05)
  • [42] CO SUBSTITUTION EFFECT ON THE ELECTRONIC-STRUCTURE OF NIS STUDIED BY X-RAY PHOTOEMISSION SPECTROSCOPY
    MAMORI, T
    MATOBA, M
    FUJIMORI, A
    ANZAI, S
    JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1992, 61 (02) : 433 - 436
  • [43] Interaction between Cobalt Phthalocyanine and Gold Studied by X-ray Absorption and Resonant Photoemission Spectroscopy
    Petraki, Fotini
    Peisert, Heiko
    Biswas, Indro
    Ayguel, Umut
    Latteyer, Florian
    Vollmer, Antje
    Chasse, Thomas
    JOURNAL OF PHYSICAL CHEMISTRY LETTERS, 2010, 1 (23): : 3380 - 3384
  • [44] Oxidation of Aqueous Phosphorous Acid Electrolyte in Contact with Pt Studied by X-ray Photoemission Spectroscopy
    Wibowo, Romualdus Enggar
    Garcia-Diez, Raul
    Bystron, Tomas
    Prokop, Martin
    van der Merwe, Marianne
    Arce, Mauricio D.
    Jimenez, Catalina E.
    Hsieh, Tzung-En
    Frisch, Johannes
    Steigert, Alexander
    Favaro, Marco
    Starr, David E.
    Wilks, Regan G.
    Bouzek, Karel
    Baer, Marcus
    ACS APPLIED MATERIALS & INTERFACES, 2023, 15 (44) : 51989 - 51999
  • [45] Electronic structure of doped LaMnO3 perovskite studied by x-ray photoemission spectroscopy
    Kowalczyk, A
    Baszynski, J
    Szajek, A
    Slebarski, A
    Tolinski, T
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2001, 13 (23) : 5519 - 5525
  • [46] Interaction of tetrachloroethylene with Pd(100) studied by high-resolution X-ray photoemission spectroscopy
    Park, KT
    Klier, K
    Wang, CB
    Zhang, WX
    JOURNAL OF PHYSICAL CHEMISTRY B, 1997, 101 (27): : 5420 - 5428
  • [47] SiO2-TiO2 interfaces studied by ellipsometry and x-ray photoemission spectroscopy
    Gallas, B
    Brunet-Bruneau, A
    Fisson, S
    Vuye, G
    Rivory, J
    JOURNAL OF APPLIED PHYSICS, 2002, 92 (04) : 1922 - 1928
  • [48] SiO2-TiO2 interfaces studied by ellipsometry and x-ray photoemission spectroscopy
    Gallas, B.
    Brunet-Bruneau, A.
    Fisson, S.
    Vuye, G.
    Rivory, J.
    Journal of Applied Physics, 2002, 92 (04): : 1922 - 1928
  • [49] Oxidation study of polycrystalline InN film using in situ X-ray scattering and X-ray photoemission spectroscopy
    Lee, Ik Jae
    Yu, Chungjong
    Shin, Hyun-Joon
    Kim, Jae-Yong
    Lee, Young Pak
    Hur, Tae-Bong
    Kim, Hyung-Kook
    THIN SOLID FILMS, 2007, 515 (11) : 4691 - 4695
  • [50] A (NH4)2Sx-treated InSb(001) surface studied by using x-ray photoelectron spectroscopy, low-energy electron diffraction, and inverse photoemission spectroscopy
    Ichikawa, S
    Suzuki, Y
    Sanada, N
    Utsumi, N
    Yamaguchi, T
    Gong, XY
    Fukuda, Y
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1999, 17 (02): : 421 - 424
12345