Trap theory of combined aging under electrical and thermal stress in polymers and its test verification

被引：0
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作者：
Li, Zhonghua [1 ]
Yin, Yi [1 ]
Zhu, Jun [1 ]
Tu, Demin [1 ]
机构：
[1] Xi'an Jiaotong Univ, Xi'an, China
来源：
Zhongguo Dianji Gongcheng Xuebao/Proceedings of the Chinese Society of Electrical Engineering | 1999年 / 19卷 / 02期
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(Edited Abstract)
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页码：70 / 74
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