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PRACTICAL APPLICATIONS OF ACCELERATED TESTING OF ELECTRONIC DEVICES.
被引：0
作者：
Jowett, C.E.
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关键词：
ACCELERATED TESTING;
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摘要：
Some of the practical applications of accelerated testing, or testing at accelerated stress levels are reviewed. The subject is limited to silicon semiconductor devices, since this is the area of product within which most of the accelerated testing experience has been gained.
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页码：19 / 23
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