Choosing a surface profiler

被引：0
|
作者：
机构：
来源：
Res Dev (Barrington IL) | / 13卷 / 35期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] Laser surface profiler
    Chu, AS
    Butler, MA
    OPTICS LETTERS, 1999, 24 (07) : 457 - 459
  • [2] Dynamic surface roughness profiler
    Kimbrough, Brad
    Brock, Neal
    Millerd, James
    ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS IV, 2012, 8501
  • [3] LARGE SCAN SURFACE PROFILER
    不详
    SOLID STATE TECHNOLOGY, 1989, 32 (08) : 73 - 74
  • [4] Dynamic surface roughness profiler
    Kimbrough, Brad
    Brock, Neal
    Millerd, James
    OPTICAL MANUFACTURING AND TESTING IX, 2011, 8126
  • [5] Choosing a surface profiler - Profiler characteristics you need to consider for film thickness applications include vertical resolution, step-height repeatability, and the system's automation capabilities.
    Chi, T
    Ballinger, T
    R&D MAGAZINE, 1999, 41 (13): : 35 - 35
  • [6] Improvement of the surface profiler for optical elements
    Tanaka, T
    Fujisawa, M
    Fukui, K
    Oshima, E
    Kinoshita, T
    SYNCHROTRON RADIATION INSTRUMENTATION, 2004, 705 : 835 - 838
  • [7] White light interferometric surface profiler
    Bowe, B
    Toal, V
    OPTICAL ENGINEERING, 1998, 37 (06) : 1796 - 1799
  • [8] The clinical utility of the Eye Surface Profiler
    Iskander, D. Robert
    INVESTIGATIVE OPHTHALMOLOGY & VISUAL SCIENCE, 2013, 54 (15)
  • [9] Fractal surface for calibration of an optical profiler
    Ma, Shuang
    Shen, Zhengxiang
    Chen, Shenghao
    Wang, Zhanshan
    OPTIK, 2014, 125 (17): : 4685 - 4688
  • [10] Development of a surface profiler for optical elements
    Kinoshita, T
    Fukui, K
    Asaka, S
    Yoshida, H
    Watanabe, M
    Horigome, T
    Ma, PJ
    Ohtsuka, K
    Iwanaga, M
    Ohshima, E
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2001, 467 : 329 - 332
12345