ECL Testing: Possibilities with In-circuit Test Systems.

被引：0

作者：

Hensel, Burkhard ^{[1
]}

机构：

[1] Firma Sperry Computersysteme GmbH, Frankfurt am Main, West Ger, Firma Sperry Computersysteme GmbH, Frankfurt am Main, West Ger

来源：

Elektronik Munchen | 1984年 / 33卷 / 11期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

LOGIC CIRCUITS

引用

页码：68 / 70

共 50 条

[31] Power Supplies Authoritative Testing. In-circuit and Functional Test in a System.
Heckmueller, Wilfred
Elektronik Munchen, 1986, 35 (15): : 105 - 107
[32] ECONOMIC IN-CIRCUIT TEST THROUGH COOPERATION WITH A TEST HOUSE
SCHUHWERK, A
WAGNER, R
F&M-FEINWERKTECHNIK & MESSTECHNIK, 1984, 92 (07): : 349 - 351
[33] Improve the Testability with In-Circuit Test and Boundary Scan Test
Mizuno T.
Journal of Japan Institute of Electronics Packaging, 2021, 24 (07) : 653 - 658
[34] AUTOMATIC QUALITY TESTING OF ASSEMBLED PRINTED-CIRCUITS USING AN IN-CIRCUIT TEST UNIT
GRAFF, A
F&M-FEINWERKTECHNIK & MESSTECHNIK, 1985, 93 (07): : 389 - 391
[35] ELIMINATING DEADLY STATIC IN IN-CIRCUIT IC TESTING
LYMAN, J
ELECTRONICS, 1987, 60 (12): : 87 - 88
[36] In-circuit software testing - beyond static analysis
Beach, M
ELECTRONIC ENGINEERING, 2000, 72 (881): : 45 - +
[37] Adding 'mixed-signal' to in-circuit testing
GenRad Inc, Concord, United States
Surf Mount Technol Mag, 4 (48-50):
[38] Machine Learning for In-Circuit Testing of Printed Circuit Board Assembly
Ivanova, Malinka
Petkov, Nikolay
AICCC 2021: 2021 4TH ARTIFICIAL INTELLIGENCE AND CLOUD COMPUTING CONFERENCE, 2021, : 221 - 228
[39] Merging flying-probe and fixture-based in-circuit test systems
Ferguson, J
EE-EVALUATION ENGINEERING, 2000, 39 (11): : 42 - +
[40] A Bead Probe CAD strategy for In-Circuit Test
Parker, Kenneth P.
DeMille, Don
2007 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, 2007, : 375 - +