ECL Testing: Possibilities with In-circuit Test Systems.

被引：0

|

作者：

Hensel, Burkhard ^{[1
]}

机构：

[1] Firma Sperry Computersysteme GmbH, Frankfurt am Main, West Ger, Firma Sperry Computersysteme GmbH, Frankfurt am Main, West Ger

来源：

Elektronik Munchen | 1984年 / 33卷 / 11期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

LOGIC CIRCUITS

引用

收藏

页码：68 / 70

相关论文

共 50 条

[1] TESTING IN-CIRCUIT ECL IS JUST ROUTINE FOR DIGITAL OSCILLOSCOPE
OLDFIELD, DJ
ELECTRONIC DESIGN, 1984, 32 (23) : 307 - &
[2] Embedded Testing in an In-Circuit Test Environment
Malian, John
Eklow, Bill
2008 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, PROCEEDINGS, 2008, : 995 - 1000
[3] A SEMIAUTOMATIC TEST SET FOR IN-CIRCUIT TESTING OF DIODES
LUTZ, OP
SOLID STATE TECHNOLOGY, 1969, 12 (04) : 39 - &
[4] CUTTING PRODUCTION COSTS WITH IN-CIRCUIT TEST SYSTEMS
THURMAN, M
SOLID STATE TECHNOLOGY, 1978, 21 (10) : 77 - 79
[5] IN-CIRCUIT TESTING AS SERVICE
BERGANDER, G
STOLL, L
F&M-FEINWERKTECHNIK & MESSTECHNIK, 1985, 93 (07): : 385 - 387
[6] IN-CIRCUIT TEST FIXTURE
HECHTMAN, CD
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 1989, 36 (02) : 192 - 196
[7] IN-CIRCUIT DIAGNOSTIC TESTING
不详
SOUTH AFRICAN JOURNAL OF SCIENCE, 1988, 84 (01) : 2 - 3
[8] IN-CIRCUIT TESTER TAKES ON ECL, TTL, AND MOS DEVICES
CARROLL, MP
PETERSON, GW
ELECTRONIC DESIGN, 1981, 29 (11) : 91 - &
[9] In-circuit testing: tomorrows methodology?
Raymond, D
ELECTRONIC ENGINEERING, 1997, 69 (851): : 51 - &
[10] ECONOMICS OF IN-CIRCUIT TESTING.
Smith, Tony
New Electronics, 1979, 12 (23): : 55 - 56

← 1 2 3 4 5 →