General fractal distribution function for rough surface profiles

被引：0
|
作者：
New Jersey Inst of Technology, Newark, United States [1 ]
机构：
来源：
SIAM J Appl Math | / 6卷 / 1694-1719期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] A general fractal distribution function for rough surface profiles
    Blackmore, D
    Zhou, JG
    SIAM JOURNAL ON APPLIED MATHEMATICS, 1996, 56 (06) : 1694 - 1719
  • [2] Fractal interpolation simulation of rough surface profiles
    Chen, Guoan
    Ge, Shirong
    Mocaxue Xuebao/Tribology, 18 (04): : 346 - 350
  • [3] A comparative study of fractal dimension calculation methods for rough surface profiles
    Chen, Zhiying
    Liu, Yong
    Zhou, Ping
    CHAOS SOLITONS & FRACTALS, 2018, 112 : 24 - 30
  • [4] Temperature rise distribution of fractal rough surface in fretting contact
    Li, Ling
    Tian, Hai-Fei
    Yun, Qiang-Qiang
    Ma, Shi-Yun
    Li, Zhi-Qiang
    Surface Technology, 2019, 48 (06): : 238 - 244
  • [5] Reconstruction of a fractal rough surface
    Cai, ZJ
    Chen, DQ
    Lu, S
    PHYSICA D-NONLINEAR PHENOMENA, 2006, 213 (01) : 25 - 30
  • [6] On the fractal model of a rough surface
    Yermolenko, S. B.
    Burkovets, D. N.
    Prydiy, A. G.
    SEVENTH INTERNATIONAL CONFERENCE ON CORRELATION OPTICS, 2006, 6254
  • [7] Fractal characterization of the distribution of reactive sites over a rough catalyst surface
    Andrade, RFS
    Cajueiro, DO
    Ferreira, CS
    PHYSICA A, 2001, 295 (3-4): : 323 - 332
  • [8] Fractal Simulation on Random Rough Surface
    Wang, Jian
    Wu, Chengbao
    Liu, Chuansheng
    Wei, Jing
    PROCEEDINGS OF THE 2015 INTERNATIONAL CONFERENCE ON AUTOMATION, MECHANICAL CONTROL AND COMPUTATIONAL ENGINEERING, 2015, 124 : 2248 - 2252
  • [9] Fractal Characterization of Nano Anisotropic Rough Surface
    Wang, Hui
    Cui, Jiwen
    Ma, Yarui
    Wu, Jianwei
    Tan, Jiubin
    TENTH INTERNATIONAL SYMPOSIUM ON PRECISION MECHANICAL MEASUREMENTS, 2021, 12059
  • [10] BRDF Analysis of material with fractal rough surface
    Qi, Chao
    Wang, Zesong
    Zhuang, Yuan
    Han, Fengling
    PROCEEDINGS OF THE 2015 10TH IEEE CONFERENCE ON INDUSTRIAL ELECTRONICS AND APPLICATIONS, 2015, : 1475 - 1479
12345