Applications of ion mobility spectrometry in monitoring vapors

被引：0
|
作者：
Reategui, Julio [1 ]
Bacon, Tad [1 ]
机构：
[1] ETG Inc, Baltimore, United States
来源：
| 1600年 / 03期
关键词：
Process control - Trace analysis;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
This paper reviews Ion Mobility Spectrometry (IMS) as a very sensitive and real-time, vapor detection technique, that offers a good balance of performance versus cost characteristics, filling the gap between the high cost analytical instrumentation and low cost, unsophisticated chemical detectors. This paper also illustrates some applications in industrial process control.
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