An automated installation for investigating current-voltage and capacitance-voltage characteristics of semiconductor devices

被引：0

作者：

Kremin', V.T. ^{[1
]}

机构：

[1] L'vovskij Gosudarstvennyj Univ im., I. Franko, L'vov, Ukraine

来源：

Pribory i Tekhnika Eksperimenta | 1998年 / 41卷 / 01期

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中图分类号：

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摘要：

引用

页码：68 / 72

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