Propagation of current-induced stacking faults and forward voltage degradation in 4H-SiC PiN diodes

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[1] [1,Stahlbush, R.E.
[2] 2,Fedison, J.B.
[3] 2,Arthur, S.D.
[4] 2,Rowland, L.B.
[5] 2,Kretchmer, J.W.
[6] 3,Wang, S.
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| / Trans Tech Publications Ltd期
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714.2 Semiconductor Devices and Integrated Circuits - 804.2 Inorganic Compounds - 933.1.1 Crystal Lattice;
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