PRECIOUS METAL PLATING THICKNESS MEASUREMENT.

被引：0

作者：

Ferrandino, Frank ^{[1
]}

机构：

[1] UPA Technology Inc, Syosset, NY, USA, UPA Technology Inc, Syosset, NY, USA

来源：

Metal Finishing | 1986年 / 84卷 / 05期

关键词：

FLUORESCENCE - GOLD PLATING - Thickness Measurement - SURFACES - Thickness Measurement - THICKNESS MEASUREMENT - X-Ray Analysis;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Several methods are available to measure precious metal plating thickness. Of these, the most effective and useful, at least on a production level, have been the beta backscatter (BBS) and x-ray fluorescence (XRF) methods. It is possible to make several analogies between BBS and XRF, but what are the differences, in terms of capability, to measure precious metal coating thickness? Are there comparative advantages offered by either method? This article attempts to offer some insight, both general and specific, to common precious metal applications, which can be used when considering the use of BBS or XRF instrumentation.

引用

页码：29 / 33