The investigation of porous silicon by the methods of X-ray diffractometry

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作者：
Ratnikov, V.V.
Astrova, E.V.
Vitman, R.F.
Lebedev, A.A.
Remenyuk, A.D.
Rud', Yu.V.
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Izvestiya Vysshikh Uchebnykh Zavedenii, Tsvetnaya Metallurgiya | / 05期
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页码：70 / 78
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