Calculation of thermoelastic stresses in microelectronics

被引：0

作者：

Matthys, Lieven ^{[1
]}

De Baetselier, Erwin ^{[1
]}

Dobbelaere, Wouter ^{[1
]}

Goedertier, Wim ^{[1
]}

De Mey, Gilbert ^{[1
]}

机构：

[1] Univ of Ghent, Gent, Belgium

来源：

Microelectronics Reliability | 1998年 / 38卷 / 03期

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D O I：

暂无

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学科分类号：

摘要：

引用

页码：443 / 448

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