Calculation of thermoelastic stresses in microelectronics

被引：0
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作者：
Matthys, Lieven [1 ]
De Baetselier, Erwin [1 ]
Dobbelaere, Wouter [1 ]
Goedertier, Wim [1 ]
De Mey, Gilbert [1 ]
机构：
[1] Univ of Ghent, Gent, Belgium
来源：
Microelectronics Reliability | 1998年 / 38卷 / 03期
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页码：443 / 448
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