CONTROL OF SULFUR DOPING FOR GaAs VPE LAYERS.

被引:0
作者
Komeno, Junji
Nogami, Masaharu
Shibatomi, Akihiro
机构
来源
Fujitsu Scientific and Technical Journal | 1981年 / 17卷 / 02期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
It has been found that the deposition of GaAs on a (111)A, (111)B, (110), or (100) oriented single crystal placed just above the substrate reduces incorporation of sulfur into GaAs VPE layers on (100) oriented substrates. Sulfur incorporation is reduced by about two orders of magnitude when the (111)A GaAs is placed just above the substrate. A technique for controlling sulfur doping into GaAs VPE layers was developed utilizing this effect. GaAs VPE layers with an extremely abrupt doping profile can be obtained for MESFET applications by using this technique. This technique also permits the growth of VPE layers with a doping profile for Lo-Hi-Lo GaAs IMPATT's with an improved conversion efficiency.
引用
收藏
页码:57 / 70
相关论文
共 50 条
  • [21] DEEP LEVEL STUDY OF VPE LAYERS FOR GAAS-FET DEVICES
    HUANG, JH
    DUBEY, M
    KASEMSET, D
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (11) : 2828 - 2831
  • [22] Rapid Determination of Concentration and Mobility Profiles on Thin GaAs Layers.
    Binet, Michel
    Acta electronica Paris, 1980, 23 (01): : 53 - 61
  • [23] DOPING OF GAAS EPITAXIAL LAYERS WITH OXYGEN
    MAKSIMOV, VL
    DVORETSKII, SA
    VASILEVA, LV
    SIDOROV, YG
    INORGANIC MATERIALS, 1980, 16 (06) : 657 - 660
  • [24] GROTESQUES OF OVAL DEFECTS ON THE MBE-GROWN GaAs LAYERS.
    Chou, Y.C.
    Lee, C.T.
    Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes, 1987, 26 (05): : 774 - 775
  • [25] DETERMINATION OF THE THICKNESS OF CHEMICALLY REMOVED THIN-LAYERS ON GAAS VPE STRUCTURES
    SOMOGYI, K
    NEMETHSALLAY, M
    NEMCSICS, A
    CRYSTAL RESEARCH AND TECHNOLOGY, 1991, 26 (08) : 1091 - 1097
  • [26] Single-crystalline GaAs, AlGaAs, and InGaAs layers grown by metalorganic VPE on porous GaAs substrates
    Yu. N. Buzynin
    S. A. Gusev
    V. M. Danil’tsev
    M. N. Drozdov
    Yu. N. Drozdov
    A. V. Murel’
    O. I. Khrykin
    V. I. Shashkin
    Technical Physics Letters, 2000, 26 : 298 - 301
  • [27] REGULAR COMPOSITIONAL STEPS GENERATED GAAS1-XPX VPE LAYERS
    KASANO, H
    JOURNAL OF APPLIED PHYSICS, 1980, 51 (08) : 4178 - 4185
  • [28] OUTDIFFUSION OF CR IN VPE GAAS-LAYERS AND BACK-SURFACE GETTERING
    MAGEE, TJ
    PENG, J
    HONG, JD
    EVANS, CA
    DELINE, VR
    MALBON, RM
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (08) : C360 - C360
  • [29] Single-crystalline GaAs, AlGaAs, and InGaAs layers grown by metalorganic VPE on porous GaAs substrates
    Buzynin, YN
    Gusev, SA
    Danil'tsev, VM
    Drozdov, MN
    Drozdov, YN
    Murel', AV
    Khrykin, OI
    Shashkin, VI
    TECHNICAL PHYSICS LETTERS, 2000, 26 (04) : 298 - 301
  • [30] SELECTIVE MOCVD GROWTH OF GaAs ON Si SUBSTRATE WITH SUPERLATTICE INTERMEDIATE LAYERS.
    Soga, Tetsuo
    Sakai, Shiro
    Umeno, Masayoshi
    Hattori, Shuzo
    Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes, 1987, 26 (02): : 252 - 255