MAGNETIC HEAD TESTER WRITE DRIVER CIRCUIT.

被引：0
|
作者：
Hisano, T.
Kusakari, T.
Takada, H.
机构：
来源：
IBM technical disclosure bulletin | 1984年 / 27卷 / 4 A期
关键词：
ELECTRONIC CIRCUITS;
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学科分类号：
摘要：
A circuit is presented which prevents the rise/fall time of writing current from being varied by the effect of an impedance variation per magnetic head under test (HUT). It provides a highly precise control of current value in the order of 0. 1%.
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