共 50 条
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- [3] Determination of diffusion coefficients in Au/Ni thin films by Auger electron spectroscopy PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 2004, 201 (09): : 2063 - 2066
- [6] DIFFUSION INDUCED GRAIN-BOUNDARY MIGRATION IN AU-AG AND AU-CU SOLID-STATE COUPLES JOURNAL OF METALS, 1979, 31 (12): : 33 - 33
- [7] ANALYSIS OF GRAIN-BOUNDARY DIFFUSION IN BIMETALLIC THIN-FILM STRUCTURES USING AUGER-ELECTRON SPECTROSCOPY JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 75 - 78
- [8] GRAIN-BOUNDARY DIFFUSION IN THIN-FILM COUPLES JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (02): : 398 - 400
- [9] DIFFUSION-INDUCED GRAIN-BOUNDARY MIGRATION IN THE AU-AG SYSTEM SCRIPTA METALLURGICA, 1984, 18 (09): : 1005 - 1010
- [10] Study on hetero-electromigration of Au-Ag thin film by scanning Auger microscopy Zhenkong Kexue yu Jishu Xuebao/Vacuum Science and Technology, 1997, 17 (05): : 304 - 310