Microwave transistor noise model extraction methods and a non-contacting scattering parameter measurement method

被引：0

作者：

Stenarson, J. ^{[1
]}

机构：

[1] Microwave Electronics Laboratory, Department of Microelectronics, Chalmers University of Technology, 412 96 Göteborg, Sweden

来源：

Doktorsavhandlingar vid Chalmers Tekniska Hogskola | 2001年 / 1773期

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共 31 条

[11] A new noise parameter measurement method for microwave devices
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[12] FM-correlation method for non-contacting level measurement of irregular surfaces using coded ultrasound
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[13] A Multi-Bias Correlated Parameter Extraction Method for Microwave Transistor Modeling
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[14] Novel non-direct contacting measurement using signal transfer model extraction and vertical coupling method
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[16] EXAMINATION OF NON-CONTACTING MEASUREMENT METHOD OF POWER GENERATION CURRENT INSIDE SINGLE POLYMER ELECTROLYTE CELL USING SIMULATED ANNEALING
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[17] A METHOD FOR MEASUREMENT OF LOSSES IN THE NOISE-MATCHING MICROWAVE NETWORK WHILE MEASURING TRANSISTOR NOISE PARAMETERS - REBUTTAL
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IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1988, 36 (01) : 172 - 172
[18] A METHOD FOR MEASUREMENT OF LOSSES IN THE NOISE-MATCHING MICROWAVE NETWORK WHILE MEASURING TRANSISTOR NOISE PARAMETERS - REPLY
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IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1988, 36 (01) : 170 - 172
[19] Experimental validation of non-contacting measurement method using LED-optical displacement sensors for vibration stress of small-bore piping
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[20] A new extraction method for the two-parameter FET temperature noise model
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Angelov, I
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