Microwave transistor noise model extraction methods and a non-contacting scattering parameter measurement method

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作者：
Stenarson, J. [1 ]
机构：
[1] Microwave Electronics Laboratory, Department of Microelectronics, Chalmers University of Technology, 412 96 Göteborg, Sweden
来源：
Doktorsavhandlingar vid Chalmers Tekniska Hogskola | 2001年 / 1773期
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摘要：
71
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页码：1 / 48
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