X-ray powder diffraction data and structural study of Fe2GeSe4

被引：8
作者：
Henao, JA
Delgado, JM
Quintero, M
机构：
[1] Univ Los Andes, Fac Ciencias, Dept Quim, Merida 5251, Venezuela
[2] Univ Los Andes, Fac Ciencias, Dept Fis, Merida 5251, Venezuela
[3] Univ Ind Santander, Fac Ciencias, Escuela Quim, Bucaramanga, Santander, Colombia
来源：
POWDER DIFFRACTION | 1998年 / 13卷 / 04期
关键词：
powder diffraction; Rietveld analysis; semiconductor compounds;
D O I：
10.1017/S0885715600010101
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The room temperature X-ray powder diffraction pattern of Fe2GeSe4, a II2 square IV VI4 semiconducting compound, has been recorded and evaluated. This material was found to be orthorhombic, a = 13.069(1), b = 7.559(1), c = 6.2037(6) Angstrom, V = 612.83(9) Angstrom(3), Z = 4, D-x =5.42 g cm(-3). The structure refinement carried out using the Rietveld method indicated that this material crystallizes in space group Pnma (No. 62) with an olivine type of structure. The refinement of 33 parameters led to R-WP = 15.3%, R-P = 10.2% for 5251 step intensities and R-B = 9.44% and R-F = 9.36% for 913 reflections. (C) 1998 International Centre for Diffraction Data. [S0885-7156(97)01302-X].
引用
收藏
页码：196 / 201
页数：6
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