Stacking faults imaged by scanning tunneling microscopy

被引：0

作者：

Tsinghua Univ, Beijing, China ^{[1
]}

机构：

来源：

Mater Lett | / 1-2卷 / 98-101期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

共 50 条

[21] SCANNING TUNNELING MICROSCOPY
NISHIKAWA, O
JOURNAL OF ELECTRON MICROSCOPY, 1988, 37 (02): : 92 - 93
[22] SCANNING TUNNELING MICROSCOPY
HANSMA, PK
TERSOFF, J
JOURNAL OF APPLIED PHYSICS, 1987, 61 (02) : R1 - R23
[23] SCANNING TUNNELING MICROSCOPY
VANDELEEMPUT, LEC
VANKEMPEN, H
REPORTS ON PROGRESS IN PHYSICS, 1992, 55 (08) : 1165 - 1240
[24] SCANNING TUNNELING MICROSCOPY
BINNIG, G
ROHRER, H
SURFACE SCIENCE, 1985, 152 (APR) : 17 - 26
[25] SCANNING TUNNELING MICROSCOPY
不详
ELECTRO-OPTICS, 1983, 15 (06): : 24 - &
[26] SCANNING TUNNELING MICROSCOPY
BINNIG, G
ROHRER, H
SURFACE SCIENCE, 1983, 126 (1-3) : 236 - 244
[27] SCANNING TUNNELING MICROSCOPY
BINNIG, G
ROHRER, H
HELVETICA PHYSICA ACTA, 1983, 56 (1-3): : 481 - 482
[28] SCANNING TUNNELING MICROSCOPY
CHIANG, S
WILSON, RJ
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1987, 193 : 10 - ANYL
[29] SCANNING TUNNELING MICROSCOPY
ROHRER, H
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 1987, 84 (14) : 4666 - 4666
[30] SCANNING TUNNELING MICROSCOPY
BINNIG, G
ROHRER, H
HELVETICA PHYSICA ACTA, 1982, 55 (06): : 726 - 735