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SUSCEPTIBILITY OF SEMICONDUCTORS TO ELECTROSTATIC DAMAGE.
被引:0
|
作者
:
Funk, R.
论文数:
0
引用数:
0
h-index:
0
Funk, R.
机构
:
来源
:
Electronic Engineering (London)
|
1983年
/ 55卷
/ 675期
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学科分类号
:
摘要
:
8
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页码:51 / 59
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