Atomic force microscopy. Imaging with electrical double layer interactions

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机构：
[1] Senden, T.J.
[2] Drummond, C.J.
[3] Kekicheff, P.
来源：
Senden, T.J. | 1600年 / 10期
关键词：
Atomic force microscopy - Born contact imaging - Electrical double layer - Surface images - Tip sample surface forces;
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