BOARD TESTERS MIMIC CPU FOR IMPROVED RESULTS.

被引：0

作者：

Walsh, Steve ^{[1
]}

机构：

[1] John Fluke Manufacturing, Everett,, WA, USA, John Fluke Manufacturing, Everett, WA, USA

来源：

Electronic Systems Technology and Design/Computer Design's | 1987年 / 26卷 / 10期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：81 / 84

共 50 条

[31] AUTOMATION: A DECADE OF RESULTS.
Nesterikhin, Yu.E.
Zolotukhin, Yu.N.
Livshits, Z.A.
Optoelectronics, Instrumentation and Data Processing (English translation of Avtometriya), 1984, (04): : 1 - 11
[32] Further Antarctic results.
不详
NATURE, 1909, 79 : 460 - 462
[33] Inquiry to readers - Results.
Deroide, JP
ANNALES DE CHIRURGIE, 1996, 50 (01): : 78 - 84
[34] Routing for Rapid Results.
Greif, Sherri
Aguilar, Michelle
STROKE, 2019, 50
[35] 68060 CPU FORMS THE HEART OF VMEBUS BOARD
NASS, R
ELECTRONIC DESIGN, 1994, 42 (07) : 137 - &
[36] BARE BOARD TESTERS FIND THE FAULTS BEFORE THE COST SOARS.
Keeler, Robert
Electronic Packaging and Production, 1984, 24 (01): : 94 - 101
[37] BENCHTOP BOARD TESTERS TAKE CUSTOM PROGRAMMING, MIXED CIRCUITRY IN STRIDE
SHERMAN, H
ELECTRONIC DESIGN, 1985, 33 (28) : 85 - &
[38] Boundary Scan Test Vector Migration into SPEA 3030 Board Testers
不详
ELECTRONICS WORLD, 2011, 117 (1898): : 6 - 6
[39] IMPROVED FAULT-FINDING WITH AUTOMATIC FUNCTIONAL TESTERS
RIEZENMAN, MJ
ELECTRONICS-US, 1972, 45 (17): : 115 - +
[40] Effect of Vibrations on Work Results.
Toenshoff, H.K.
Kuhfuss, B.
TZ fur Metallbearbeitung, 1981, 75 (09): : 34 - 36