PRECISION SUBNANOSECOND DELAY MEASUREMENTS OF HIGH SPEED DIGITAL INTEGRATED CIRCUITS.

被引：0
|
作者：
Ryan, Carl
Leskela, Michael
机构：
来源：
| 1977年
关键词：
TIME DELAYS;
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学科分类号：
摘要：
A system for providing detailed performance parameters of high speed integrated circuits requires a carefully designed signal source as well as operational considerations in order to obtain a resolution which is consistent with the circuit performance. This paper describes a signal source and a method for making precise measurements of high speed digital integrated circuit time delays by a frequency domain technique instead of direct time domain methods. Resolutions to 1 picosecond are possible with absolute accuracies approaching 10 picoseconds. It can be used to test a variety of circuit types and can be applied production environments. The text of this paper is in digest form.
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页码：224 / 226
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