Void electromigration as a moving free-boundary value problem

被引：1

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作者：

Ben, Amar, M. ^{[1
]}

机构：

[1] Laboratoire de Physique Statistique, Ecole Normale Supérieure, 24, rue Lhomond, 75231 Paris Cedex 05, France

来源：

Physica D: Nonlinear Phenomena | 1999年 / 134卷 / 02期

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页码：275 / 286

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