TEST STRATEGY DEVELOPMENT: A BROAD APPROACH.

被引：0

作者：

Martin, Mike ^{[1
]}

机构：

[1] Tektronix Inc, Vancouver, WA, USA, Tektronix Inc, Vancouver, WA, USA

来源：

Electron Manuf | 1988年 / 34卷 / 05期

关键词：

ELECTRONIC CIRCUITS - Testing;

D O I：

暂无

中图分类号：

TN7 [基本电子电路];

学科分类号：

080902 ;

摘要：

Current manufacturing industry trends significantly impact new product test strategies, and today's business environment requires a broad selection perspective. The paper discusses types of test systems, forces affecting test strategy, general test philosophies and product test strategy selection.

引用

页码：25 / 28

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