Transmission Electron Microscopic Observation of Grain Boundaries in CVD Diamond Thin Films

被引：0

作者：

Zhang, Yaogang ^{[1
]}

Ichinose, Hideki ^{[1
]}

Nakanose, Megumi ^{[2
]}

Ito, Kunio ^{[1
]}

Ishida, Yoichi ^{[1
]}

机构：

[1] Department of Materials Science, Faculty of Engineering, The University of Tokyo., Hongo, 7-3-1. Bunkyo-ku., Tokyo,113, Japan

[2] 'Aerospace Division. Ntssan Motor Inc.., Momoi 3-5-1. Suginami-ku, Tokyo,167, Japan

来源：

Microscopy | 1996年 / 45卷 / 05期

关键词：

This research was supported by the Foundation Cor Promotion of Material Science and Technology of Japan and the Subsidy for Scientific Research of the Ministry of Education; Science. Sports and Culture of Japan. The first author also acknowledges the financial support from [!text type='JS']JS[!/text]PS Research Fellowships for Young Scientists;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：436 / 441

共 50 条

[41] HIGH-ORDER TWIN BOUNDARIES IN CVD DIAMOND FILMS
SHECHTMAN, D
FELDMAN, A
HUTCHISON, J
MATERIALS LETTERS, 1993, 17 (05) : 211 - 216
[42] Electron field emission from thin fine-grained CVD diamond films
Lacher, F
Wild, C
Behr, D
Koidl, P
DIAMOND AND RELATED MATERIALS, 1997, 6 (09) : 1111 - 1116
[43] PREPARATION OF THIN GLASS FILMS FOR ELECTRON MICROSCOPIC EXAMINATION BY DIRECT TRANSMISSION
STEWART, IM
GREEN, L
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1967, 44 (03): : 216 - &
[44] Electron microscopic characterization of microcrystalline silicon thin films deposited by ECR-CVD
Sieber, I
Wanderka, N
Kaiser, I
Fuhs, W
THIN SOLID FILMS, 2002, 403 : 543 - 548
[45] Grain boundaries and mechanical properties of nanocrystalline diamond films
Busmann, HG
Pageler, A
Brauneck, U
Gruen, DM
METASTABLE, MECHANICALLY ALLOYED AND NANOCRYSTALLINE MATERIALS, PTS 1 AND 2, 2000, 343-3 : 255 - 260
[46] Grain boundaries and mechanical properties of nanocrystalline diamond films
Busmann, Hans-Gerd, 2000, Trans Tech Publ, Uetikon-Zuerich, Switzerland (343)
[47] MELT GROWTH OF CDTE CRYSTALS AND TRANSMISSION ELECTRON-MICROSCOPIC INVESTIGATIONS OF THE GRAIN-BOUNDARIES
SABININA, IV
GUTAKOVSKI, AK
MILENOV, TI
LYAKH, NN
SIDOROV, YG
GOSPODINOV, MM
CRYSTAL RESEARCH AND TECHNOLOGY, 1991, 26 (08) : 967 - 972
[48] DIRECT TRANSMISSION ELECTRON MICROSCOPE OBSERVATION OF ELECTROTRANSPORT IN ALUMINUM THIN FILMS
BLECH, IA
MEIERAN, ES
APPLIED PHYSICS LETTERS, 1967, 11 (08) : 263 - &
[49] Electron microscopic studies of grain boundaries in polycrystalline sphBN
Britun, V.F.
Sverkhtverdye Materialy, 1993, (06): : 12 - 19
[50] OBSERVATION OF SWITCHING OF THIN FILMS BY MEANS OF A STROBOSCOPIC TRANSMISSION ELECTRON MICROSCOPE
PETROV, VI
SPIVAK, GV
PAVLYUCHENKO, OP
IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1967, 31 (03): : 362 - +

← 1 2 3 4 5 →