Mechanical modeling of projection electron-beam lithography masks

被引:0
|
作者
Univ of Wisconsin-Madison, Stoughton, United States [1 ]
机构
来源
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [31] ELECTRON-BEAM LITHOGRAPHY
    PEASE, RFW
    CONTEMPORARY PHYSICS, 1981, 22 (03) : 265 - 290
  • [32] ELECTRON-BEAM LITHOGRAPHY
    HERRIOTT, DR
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (03) : C102 - C102
  • [33] Electron-beam lithography
    Harriott, L
    Liddle, A
    PHYSICS WORLD, 1997, 10 (04) : 41 - 45
  • [34] MODELING OF ELECTRON-BEAM SCATTERING IN HIGH-RESOLUTION LITHOGRAPHY FOR THE FABRICATION OF X-RAY MASKS
    GENTILI, M
    LUCCHESINI, A
    SCOPA, L
    LUGLI, P
    PAOLETTI, A
    MESSINA, G
    SANTANGELO, S
    TUCCIARONE, A
    EUROPEAN TRANSACTIONS ON TELECOMMUNICATIONS, 1990, 1 (02): : 143 - 148
  • [35] Electron scattering by electron-beam mask with tapered aperture in cell projection lithography
    Yamashita, H
    Ema, T
    Itoh, K
    Nozue, H
    Nomura, E
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (06): : 3845 - 3849
  • [36] Character Design and Stamp Algorithms for Character Projection Electron-Beam Lithography
    Du, Peng
    Zhao, Wenbo
    Weng, Shih-Hung
    Cheng, Chung-Kuan
    Graham, Ronald
    2012 17TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE (ASP-DAC), 2012, : 725 - 730
  • [37] COMPARISON OF ELECTRON-BEAM AND OPTICAL PROJECTION LITHOGRAPHY IN THE REGION OF ONE MICROMETER
    CHANG, TS
    KYSER, DF
    TING, CH
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1981, 275 : 117 - 121
  • [38] DESIGN AND TESTING OF A CORRECTED PROJECTION LENS SYSTEM FOR ELECTRON-BEAM LITHOGRAPHY
    ANGER, K
    FROSIEN, J
    LISCHKE, B
    SIEMENS FORSCHUNGS-UND ENTWICKLUNGSBERICHTE-SIEMENS RESEARCH AND DEVELOPMENT REPORTS, 1980, 9 (03): : 174 - 178
  • [39] ELECTRON-BEAM CELL PROJECTION LITHOGRAPHY - ITS ACCURACY AND ITS THROUGHPUT
    SOMEDA, Y
    SATOH, H
    SOHDA, Y
    NAKAYAMA, Y
    SAITOU, N
    ITOH, H
    SASAKI, M
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (06): : 3399 - 3403
  • [40] Chemically amplified resists for electron-beam projection lithography mask fabrication
    Magg, C
    Lercel, M
    EMERGING LITHOGRAPHIC TECHNOLOGIES IV, 2000, 3997 : 276 - 283