X-ray diffraction on a multilayer mirror modulated by surface acoustic waves

被引:0
|
作者
Roshchupkin, D.V. [1 ]
Schelokov, I.A. [1 ]
Tucoulou, R. [1 ]
Brunel, M. [1 ]
机构
[1] Russian Acad of Sciences, Moscow, Russia
来源
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms | 1997年 / 129卷 / 03期
关键词
Number:; INTAS-93-171; l; Acronym:; -; Sponsor:; NATO; Sponsor: North Atlantic Treaty Organization; CNRS; Sponsor: Centre National de la Recherche Scientifique;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:414 / 418
相关论文
共 50 条
  • [11] Elastic strains in GaAs/AlAs quantum dots studied by high resolution x-ray diffraction
    Masaryk Univ, Brno, Czech Republic
    Solid State Electron, 1-8 (373-377):
  • [12] Surface effects in displacive phase transformations studied by X-ray specular reflectivity
    Klemradt, U.
    Fromm, M.
    Landmesser, G.
    Amschler, H.
    Peisl, J.
    Physica B: Condensed Matter, 1998, 248 : 83 - 89
  • [13] Application of image plate for structural studies of carbon nanotubes by high-energy X-ray diffraction
    Hawelek, L.
    Koloczek, J.
    Burian, A.
    Dore, J.C.
    Honkimäki, V.
    Kyotani, T.
    1600, Elsevier Ltd (401): : 1 - 2
  • [14] High-resolution synchrotron X-ray powder diffraction with a linear position-sensitive detector
    Lehmann, M.S.
    Christensen, A.N.
    Nielsen, M.
    Feidenhans'l, R.
    Cox, D.E.
    Journal of Applied Crystallography, 1988, 21 (06): : 905 - 910
  • [15] In situ observation of anodic dissolution process of p-GaAs(001) in HCl solution by surface X-ray diffraction
    Uosaki, Kohei
    Koinuma, Michio
    Kondo, Toshihiro
    Ye, Shen
    Yagi, Ichizo
    Noguchi, Hidenori
    Tamura, Kazuhisa
    Takeshita, Kunikazu
    Matsushita, Tadashi
    Journal of Electroanalytical Chemistry, 1997, 429 (1-2): : 13 - 17
  • [16] X-ray powder diffraction data and structure refinement of CeFeGe3
    Yan, Jialin
    Wu, Shiwei
    Ou, Xiangli
    Zeng, Lingmin
    Hao, Jianmin
    Powder Diffraction, 1998, 13 (02): : 241 - 243
  • [17] Grazing incidence X-ray reflectivity: A new experimental approach to the martensitic surface relief
    Ludwig-Maximilians-Universitaet, Muenchen, Munich, Germany
    Mater Sci Eng A Struct Mater Prop Microstruct Process, (291-295):
  • [18] Processing and analysis of X-ray photoelectron diffraction data using IGOR Pro
    Liang, Xihui (liangxh@hotmail.com), 1600, Wiley-Blackwell, 5 Abbey Road, Chester, CH1 2HU, United Kingdom (51):
  • [19] X-ray diffraction measurements for expanded fluid selenium up to the metallic region
    Inui, M.
    Noda, T.
    Tamura, K.
    Journal of Non-Crystalline Solids, 1996, 205-207 (pt 1) : 261 - 264
  • [20] Surface properties of vanadium compounds by X-ray photoelectron spectroscopy
    Department of Chemical Engineering, Hannam Univ., 133 Ojeong-dong, T., Taejon, Korea, Republic of
    Appl Surf Sci, 1 (64-72):