METHOD OF DETERMINATION OF THE DIELECTRIC CHARACTERISTICS OF VERY FINE SILICON NITRIDE POWDERS.

被引：0
|
作者：
Petrovskii, V.Ya. [1 ]
Kirilenko, V.M. [1 ]
Gnesin, G.G. [1 ]
Kas'yanenko, A.A. [1 ]
机构：
[1] Acad of Sciences of the Ukrainian, SSR, Inst of Problems of Materials, Science, USSR, Acad of Sciences of the Ukrainian SSR, Inst of Problems of Materials Science, USSR
来源：
Soviet powder metallurgy and metal ceramics | 1984年 / 23卷 / 09期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
15
引用
收藏
页码：722 / 727
相关论文
共 50 条
  • [31] PREPARATION OF FINE SILICON-NITRIDE POWDERS BY VAPOR-PHASE REACTION OF NITROGEN CONTAINING ORGANOSILICON COMPOUND WITH AMMONIA
    SUZUKI, T
    KAWAKAMI, T
    KOYAMA, T
    IZAKI, K
    NAKANO, R
    SHITARA, T
    HAKKEL, K
    HIRAI, T
    NIIHARA, K
    YOGYO-KYOKAI-SHI, 1987, 95 (01): : 81 - 85
  • [32] FEATURES OF DETERMINATION OF THE OXYGEN AND NITROGEN CONTENTS IN ALUMINUM NITRIDE AND OXIDE POWDERS BY THE METHOD OF REDUCTION EXTRACTION
    DUBOK, VA
    KORNILOVA, VI
    GARBUZ, VV
    SOVIET POWDER METALLURGY AND METAL CERAMICS, 1990, 29 (03): : 206 - 209
  • [33] METHOD FOR THE DETERMINATION OF THE STRESS IN, AND YOUNGS MODULUS OF SILICON-NITRIDE PASSIVATION LAYERS
    VANNIE, AG
    SOLID STATE TECHNOLOGY, 1980, 23 (01) : 81 - 84
  • [34] Simultaneous Direct Determination of Aluminum, Calcium and Iron in Silicon Carbide and Silicon Nitride Powders by Slurry-Sampling Graphite Furnace AAS
    Hirotsugu Minami
    Masako Yada
    Tomomi Yoshida
    Qiangbin Zhang
    Sadanobu Inoue
    Ikuo Atsuya
    Analytical Sciences, 2004, 20 : 455 - 459
  • [35] Simultaneous direct determination of aluminum, calcium and iron in silicon carbide and silicon nitride powders by slurry-sampling graphite furnace AAS
    Minami, H
    Yada, M
    Yoshida, T
    Zhang, QB
    Inoue, S
    Atsuya, I
    ANALYTICAL SCIENCES, 2004, 20 (03) : 455 - 459
  • [36] A New Method for the Determination of the Reflection and Transmission Characteristics of Dielectric Materials
    Kim, Jeong-Hwan
    Kang, Jin-Seob
    Park, Jeong-Il
    Kang, Tae-Weon
    2014 83RD ARFTG MICROWAVE MEASUREMENT CONFERENCE (ARFTG): MICROWAVE MEASUREMENTS FOR EMERGING TECHNOLOGIES, 2014,
  • [37] Determination of the very low-frequency characteristics of dielectric materials: A surface potential approach
    Pouilles, V
    Lebey, T
    Castelan, P
    JOURNAL OF APPLIED PHYSICS, 1996, 79 (11) : 8620 - 8628
  • [38] DEMONSTRATION OF A SILICON-NITRIDE ATTRITION MILL FOR PRODUCTION OF FINE PURE SI AND SI3N4 POWDERS
    HERBELL, TP
    GLASGOW, TK
    ORTH, NW
    AMERICAN CERAMIC SOCIETY BULLETIN, 1984, 63 (09): : 1176 - 1178
  • [39] Dielectric properties measurements on silicon nitride fiber based on high-Q cavity method
    Li Q.
    Kong W.
    Li Z.
    Wang S.
    Wang S.
    Gu Y.
    Li M.
    Fuhe Cailiao Xuebao/Acta Materiae Compositae Sinica, 2020, 37 (09): : 2240 - 2249
  • [40] Effects of Deposition Method of PECVD Silicon Nitride as MIM Capacitor Dielectric for GaAs HBT Technology
    Yota, Jiro
    SILICON NITRIDE, SILICON DIOXIDE, AND EMERGING DIELECTRICS 11, 2011, 35 (04): : 229 - 240
12345