Methods for Obtaining Evidence of Silicate Films on Very Thin Sheet, Using Electron Optics.

被引：0
|
作者：
Puderbach, H.
Schoenemann, R.
机构：
来源：
| 1600年 / 29期
关键词：
MICROSCOPIC EXAMINATION;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
When very thin steel sheet is degreased, silicate-containing cleaning agents leave a silicate layer on the sheet which protects the metal during subsequent annealing and also prevents sticking of the windings in a coil. Transmission electron microscopes and scanning electron microscopes with an energy-dispersive microanalyzer attachment are used to study replicas of silicate coated sheet surfaces. Techniques are discussed and results evaluated.
引用
收藏
相关论文
共 50 条
  • [21] Electron transport and spin scattering in very thin disordered metallic films
    Paja, A.
    Spisak, B. J.
    ACTA PHYSICA POLONICA A, 2007, 112 (06) : 1289 - 1295
  • [22] SMALL-ANGLE ELECTRON DIFFRACTION OF VERY THIN GROWING FILMS
    HERITAGE, MB
    TOMPSETT, MF
    JOURNAL OF APPLIED PHYSICS, 1970, 41 (01) : 407 - &
  • [23] ELECTRON-BEAM LITHOGRAPHY WITH VERY THIN, HIGHLY ORDERED FILMS
    BOOTHROYD, B
    DELANEY, PA
    HANN, RA
    JOHNSTONE, RAW
    POLYMER DEGRADATION AND STABILITY, 1987, 17 (03) : 253 - 262
  • [24] The study of very thin lubricant films in high pressure contacts using spacer layer interferometric methods
    Spikes, HA
    FUNDAMENTALS OF TRIBOLOGY AND BRIDGING THE GAP BETWEEN THE MACRO-AND MICRO/NANOSCALES, 2001, 10 : 663 - 689
  • [25] Electron structure of thin fullerene films deposited by various methods
    A. L. Shakhmin
    A. M. Khodorkovskii
    S. V. Murashov
    T. O. Artamonova
    A. V. Golod
    Technical Physics Letters, 2001, 27 : 87 - 89
  • [26] METHODS FOR INTERPRETING ELECTRON DIFFRACTION PATTERNS OF THIN ALLOY FILMS
    BICKNELL, JA
    LIPSON, H
    NATURE, 1967, 213 (5072) : 169 - &
  • [27] Electron structure of thin fullerene films deposited by various methods
    Shakhmin, AL
    Khodorkovskii, AM
    Murashov, SV
    Artamonova, TO
    Golod, AV
    TECHNICAL PHYSICS LETTERS, 2001, 27 (02) : 87 - 89
  • [28] Evidence for strong Auger electron diffraction in thin metallic films
    Hüger, E
    Osuch, K
    EUROPHYSICS LETTERS, 2003, 62 (02): : 278 - 284
  • [29] Measurement of thin films using very long acoustic wavelengths
    Clement, G. T.
    Nomura, H.
    Adachi, H.
    Kamakura, T.
    JOURNAL OF APPLIED PHYSICS, 2013, 114 (23)
  • [30] CONVERSION ELECTRON MOSSBAUER-SPECTRA OF VERY THIN GOLD-FILMS
    SAWICKI, JA
    SAWICKA, BD
    HYPERFINE INTERACTIONS, 1983, 16 (1-4): : 1013 - 1016
12345